Modular Test Code for Microcontroller Units with ROM

This paper describes the concept of a modular test code developed to reside in Microcontroller Units (MCUs) with Read-Only Memory (ROM) to make easier the test bench evaluation of integrated circuit (IC) prototypes designed at Brazil Semiconductor Technology Center (BSTC). MCU standard input/output ports are used to select independent operating modes and to transfer data from/to a hostcomputer. At test bench, limited instrument resources and MCU Random-Access Memory (RAM) small size make it difficult the use of the MCU built-in test mode for evaluation purposes. As the modular test code does not depend on the MCU built-in test mode to run, it is a useful tool for testing internal device modules functionally during prototype stage. This modular test code is a complement to the IC test before the Automatic Test Equipment (ATE) program is ready.